The Design And Realization Of A Small Solid-state Memory Device And Ground Test Equipment

As memory device is more and more important in the telemetry system, how to improvethe reliability of memory device recording data under the environment of high overload, highshock becomes a key to the design of solid-state memory device. Solid-state memory devicebased on FLASH takes advantage of its nonvolatile characteristics, adapting to the badenvironment and advanced storage technology to improve the performance of memory devicefrom its own performance. At the same time, the design of ground test equipment of thesolid-state memory device can fully test the memory device. It provides a basis for theproduction improvement of solid-state memory device.For the solid-state memory device and ground test equipment design requirements andthe characteristics of the subject itself, the design adopts the ideal of the modular design andhigh reliability. It proposes solid-state memory device and ground test equipment overalldesign principles and design programs, and completes the following works:(1)Solid-state memory device and ground test equipment are based on FPGA as controlcore, the solid-state memory device completes the collection of two channels of analogsignals and a channel of PCM digital signal, and mixes them to store into FLASH. Groundtest equipment can simulate aircraft environment to send commands, analog or digital signalsto the solid-state memory device, monitor the data information of solid-state memory devicein real-time, and recover stored data in solid-state memory device to analysis and processing.(2)This paper focuses on introducing FIFO and RS-422, and comprehensivelyintroduces FLASH programming techniques, including invalid block management, blockerasing, page programming and reading data.(3)Because of the solid-state memory device and its ground test equipment developingand validating each other at the same time leads to a failure that is hard to determine the source of their problems.Ground test equipment adopts standardization design method,andunifies its communication protocol.At the end of this paper, the function of the solid-state memory device is tested.Theperformance of the device is analyzed acocording to the result, and the lack of device isimproving. The test results show that the solid-state memory device can fully meet the designrequiments of the task, and play high reliability.