Research On Design Method Of PDK In SKILL Programming

In full-custom circuit design, PDK(Process Design Kit) is the connection between semiconductor manufacturers and the circuit design engineers. With the increasing complexity of circuit design, PDK design is more difficult. In today’s market, the environment of PDK design is relatively closed, and the design method has been fixed for some time.As the main approach to extract parameters, assess processing tool performance, formulate layout design rules, detect or quantify random and systematic defects, establish product reliability, test chips play an important role in reducing process development cycle and improving manufacturing yield. However, the increasingly complicated processes of nano-era require a lot more test structures than the amount that traditional test chips can accommodate. Under such a circumstance, because the test chip design for PDK can measure a number of structures in a certain area of a wafer, test chips have become a hot research area.The main purpose of this study is to propose the PDK design method based on SKILL programming and graphically drawing, which focuses on parameterized-cells, the core part of the composition. Parameters-cell can be designed efficiently, be instanced in quantities, and can be applied to the industry mainstream design process. It can also reduce the production cycle cost of the testchip for PDK. A testchip for PDK in forty-nanometer has been developed by this method. The entire development process shows that this method is efficient and accurate.