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Research Of USB3.0for Store Testing System

Posted on:2014-02-24Degree:MasterType:Thesis
Country:ChinaCandidate:Y S DaiFull Text:PDF
GTID:2248330395992071Subject:Measuring and Testing Technology and Instruments
Abstract/Summary:PDF Full Text Request
USB interface is a bus interface standard. It has won a marketplace approve and beenpopularized promptly with its obvious benefits, such as very high transfer rate, easy to expand,plug and play and compatibility, and has been widely applied to data transmission and imageacquisition. The new USB3.0protocol brought up in2008requires the maximumtransmission bandwidth between computer and USB device is5.0Gbps.In recent years,Our laboratory developed in GB large capacity store testing system forthe unit,And mass store testing system also has on the development agenda. Aiming at theexchange problems of store testing system and computer, it puts forward USB3.0datatransmission interface, to overcome the shortcomings of slow in the existing interface datatransfer, and verified the feasibility of the system.The following aspects of this paper were proposed:1.Analyses the characteristics of the lab test system interface,comprehensive comparisonof the advantages and disadvantages of various high-speed interface,and introduced therelated protocol and characteristics of USB3.0technology;2.Based on the subject and object, choose USB3.0chip CYUSB3014as the USB3.0control chip, build the hardware system framework, draw the hardware schematic diagram,and drawing PCB layout in accordance with the requirements of the high-speed circuit PCBdesign and the PCB layout requirements of USB3.0super-speed device.Development of USBfirmware program, set up various descriptors of USB device, set the endpoint and DMAtransmission channel,design GPIF Ⅱ state machine.Install device driver for USB3.0devices,and development PC application, provide the human-computer interaction interface;3.Program the FPGA of main control chip with VHDL hardware description language tocoordinate data transmission according to the logic timing requirements when the GPIFinterface of USB3.0working in SLAVE FIFO mode.And complete the test at last.
Keywords/Search Tags:Store Testing System, USB3.0, CYUSB3014, data transmission, GPIF Ⅱ
PDF Full Text Request
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