Design And Implementation Of IC Test System Based On LabVIEW

With the great progress in Modern Science and technology, a variety of electronic products are booming and emerging up in the market. As an indispensable core component, Integrated Circuit became more extensive not only in its category but fields of application as well. It is almost everywhere around us, from the household appliances, multimedia computer, mobile phone to Auto electronics, further promoting the development of electronic chip industry. Therefore more complex its design could be, much higher testing requirements will be applied. In order to meet the growing demand, it is necessary for the chip manufacturers to improve its capability and productive processions. To chip testing section, the improvement on the chip testing management on its flexibility, stability and reliability is needed to ensure the capability to customers'diversity, while ensuring the prior testing before the mass production. This paper mainly introduced an Integrated Circuit test system based on the virtual instrument of LabVIEW, which connected the testing machines by GPIB cable. It is much more efficiency and flexibility than traditional manual test method.To design the test system, we made below work:(1) System design. During test system, the computer can send command to MCU through RS232. MCU send instructions to IC which was tested through SPI and accepted respond. The computer sent command through GPIB protocol and get feedback from test instruments.(2) In this test system, in order to simulate different type of temperature and working environment, we use temperature control machine to control environment temperature when chip was tested to simulate different type of work environment.(3) Function design. In order to test RDS(on) parameter of MOSFET and CSR parameter of chip at different type of temperature, voltage and current, we used temperature cycle part, voltage cycle part and current part in the program..This system is unique due to its simple practical and perfect function chip test solutions. It is greatly improve the efficiency of the IC testing and avoids tedious repeatability of test equipment operation.