Time Domain Parameters Of The Dynamic Characteristics Of Ic Test

With the development of integrated circuits, the demand for IC form aviation, transportation, defense equipment and other industry are increasing and circuit run rates continue to increase. Because of above, the time domain response of integrated circuit chips has been made more stringent requirements. As one of integrated circuit testing automatic test system, time domain parameters of IC has attracted more attention. One of time-domain parameters of IC test equipment has been realized in this article, which has a good versatility.First of all, based on introduces the development of IC measurement, the significance of time domain parameters measurement has been introduced in this paper. Then, the analysis of the specific performance parameters of time-domain measurements in IC testing is also finished. And, according to several commonly used test method in time domain parameters, the correct method is selected with the analysis. Besides, the hardware circuit is also implemented as well as the driver function which will be called by user or other functions. To facilitate users, a user interface program is also designed in this paper. Finally, the paper presents the measurement data reporting, analysis and reports which show that the measurement of performance to good effect. In addition, the summarizing of some problems and solutions in the design adopted for further studies provide convenient conditions.The design, described in this paper, has been used in product in one of IC manufacturers, and has a good performance in Stability, efficiency, versatility and low cost. That is to say, the design is suit for domestic IC manufacturing factory.