Time Parameter And Dc Parameter Measurement Unit For IC Test System

IC (Integrated Circuit) Test is an important component in IC industry. IC TestSystem can automatically test IC parameters, such as time parameters and DCparameters which are the important indictor of the chip performance. Therefore, ICparameters test using IC Test System has become a necessary method to identify thechips whether meeting the requirement of engineering application and design.The thesis describes the development of the classifications, the development andthe irreplaceable meanings to the IC industry. Based on a modular design principle, thepaper studied the architecture of the IC test system, including power module, functionmodule, main control module, FPGA platform. On this basis, the paper focuses on timemeasurement unit and DC parameter measurement unit in function module. It is mainlyabout two sections as below.First of all, basing IC Test System to analysis the quota requirements of timeparameter measurement, try different principles and methods of Time to DigitalConverter, select the time measurement method that is based on FPGA Quad Clock andcomplete FPGA Digital Logic Design finally. This paper elaborates on the hardwarecircuit design of time measurement unit, containing multi-channel design, key devicesselections, and after the final experimental verification, Time Measurement Unit canachieve a resolution of2ns.Second, basing IC Test System to analysis quota requirements of DC parametermeasurement, practice two usual DC parameter measurement methods. One is to forcevoltage and measure current, and the other is to force current and measure voltage.According to the voltage range, this design divided DC Parameter Measurement Unitinto low pressure channel with a voltage range of [-20V,20V], and high pressurechannel with voltage range of [-60V,60V], both can provide high current output of2A.To improve the measurement accuracy, the design uses Kelvin connection method.Paper provides a detailed study of the problems of hardware circuit in this module, suchas digital logic design of power device selection, over-voltage and over-currentprotection, voltage isolation. And as a replacement of the power integrated in thismodule, the paper also studied Output Capacitorless Circuit design.