Research On The Current Test Of High Performance Processor Ic

Nowadays, the processor and computer system are developing more and more complex. The current measurement is taking an important role compared with general design process, which is necessary trend for electrical industry. The trend of electrical industry is to provide more portable and functional. It is widely used in all kinds of portable electrical instruments and consumer electronic equipments. This becomes especially important in the case of handheld devices, cellular phones etc. the most important features of mobile device design is low power consumption. This becomes especially important in the case of handheld devices, cellular phones etc. the most important features of mobile device design is low power consumption. i.MX35 high performance processor which was provided by Freescale Semiconductor has high level specification for current test. Current measured in different condition which IC has been set to different mode.The paper focuses on describing the function and technology of current measurement of processor. It is based on the theory of current measurement and current test method, such as open/short, static and dynamic idd. The paper also instructed test equipment which included hardware, software and system document. Freescale developed his own current test program for i.MX35 processor. Designed different experiment according to customer application, then collected data. Analyzed data with Minitab so that the test limit have high test coverage and also do not have big impact on test yield. Finally, find the proper current limit based on experiment result and updated it.