Applation Of The SPI Bus Protocol On Agilent 3070 In-Circuit-Test System

The articles describe SPI communication protocol, theory and M35SW16 EEPROM application and realization on Agilent 3070 in circuit test system. The article used the BT-Basic language and in circuit test system digital logical communication function, finished the write and read function for IC M35SW16.First the section description SPI communication protocol application background on in-circuit-test system and the advantage of realization the function. Then introduce SPI communication protocol structure, standard, theory and application. SPI (Serial Peripheral interface), First Motorola company define and apply the function on MC68HCXX. SPI interface is used to EEPROM, FLASH, clock, AD convert, digital signal processor and digital signal decode. SPI is high speed, full duplex and synchronal communication bus, the pins of IC is only use four pins to reduce the quantity pins of IC. Now more and more IC use the kind of communication protocol, for example M35SW16. The article use the IC M35SW16, the character of IC function, the define of command.The article introduces Agilent 3070 and description the system hardware software and function. It detailed described the test theory, digital logic communication function and the internal hardware logic structure. The system apply the method of module measurement and it can supply four module to control four extra direct current. There are four control channel on the direct current. Every module may independent work and may connect with together work to test one PCB board. So user may select different equipment config according to different PCB board. The system has all kind of testability and is very stable, it may test resistor, capacitance, induct, diode. The function test may test voltage, frequency and digital analog combine test. This article use digital test function to setup SPI communication bus. Finally, the articles make a detailed study for implementation process of SPI on ICT according to the introduction and description of the above content. Focusing on the hardware design process is described, and its peripheral circuits of the theory of hardware, software implementation of the logic control process. The experiments use the BT-Basic language via through the Agilent 3070 (ICT) functions of the digital communications interface, programmable logic control. At the same time, the display will output the process and result of success. Then uses of SPI bus protocol through the input and output logic level of ICT to erase the entire IC, and then written the data into the IC. Finally, it is the process of experiments validation, the experiment use a dual-channel oscilloscope to track the results of this experiment, first demonstrated the process of writing data, a channel to track the clock signal, a data channel to track the input signal. Then it shows the process of reading data, a channel to track the process of write the command, the other channel to track the read signal. According to write data and read out the data to compare the results of the experiment to approve that the result that ICT on the SPI communications is full realized.Finally, this paper describes the test system and the future direction of development and there were a few flaws at this stage.The field test in the future, people begin to pay attention to a number of the integrated test system problem, because the test in the production process is always to use a number of test systems, this will lead to the production time and cost on a large number of waste Therefore, people have not only satisfy the test in a process to increase their function, but think it will be integrated together for the testing process, and then into a brand new, with all the features of the test system. For example, AOI (Auto Optic Inspect), X ray (X ray), and ICT are important electronic assembly line of the testing process, but they have their own characteristics and technology, can not be substitute for each other, so people can look forward to the future More of the testing process, integrated into a system. This may be the future direction of development of the field test.