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The Key Technology Research Of ROIC For A High Gain, New Principle Photoelectric Sensors

Posted on:2009-01-23Degree:MasterType:Thesis
Country:ChinaCandidate:J HuangFull Text:PDF
GTID:2178360245973371Subject:Microelectronics and Solid State Electronics
Abstract/Summary:PDF Full Text Request
An approach benefit designs of readout integrate circuits (ROIC) for a high gain, new principle photoelectric is proposed in this paper. The ROIC design mainly contains the Capacitor Feedback Tran impedance Amplifier (CTIA) and Correlated Double Sampling (CDS) structure. The test results of these ROICs fabricated by 0.6μm CMOS technology indicate that the ROICs have high capability and low noise performances as expected.The main contents are as follows:(1) The digital module designs of ROIC are proposed. As a key step in our incremental effort to construct large format IR arrays, we discuss the digital module designs of ROIC channels (1×16) and ROIC arrays (2×8, 32×32). Some especial designs which can meet performance requirements of big arrays are instanced afterwards. And four different PAD of ROIC with Electrostatic Discharge (ESD) protection circuits are designed.(2) A testing system is established to measure the parameters of ROICs which show a joyful performance. The key functional modules such as CTIA, CDS and amplifier modules are also tested. And the results show the anticipant performances. At the same time, the results show clearly faulty performances which should improved in the future.(3) Based on the test results, we discuss the Noise capability firstly, including KTC, FPN and 1/f noise. A new CDS circuit module is proposed with a more simple structure. Low temperature characteristic of MOSFET such as Freeze-out Effect and Kink Effect are analyzed. A Deep Sub-micron CMOS technology ESD protection circuit is also proposed come to heel.The designing, testing and analyzing of ROIC for the high Gain, New Principle Photodiodes are explicated in this paper, which provides certain instructions to the laboratorial research on the design of the ROIC. The problems and difficulties during designing and testing are analyzed and the possible solution is also presented.
Keywords/Search Tags:Readout Integrated Circuit (ROIC), digital module design, IC testing, parameters analysis, Electrostatic Discharge (ESD) Protection Circuits
PDF Full Text Request
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