Research On The Transient Disturbance Effect Analysis And Modeling Of Integrated Circuits Under The Electrostatic Discharge

The integrated circuit is becoming the basic unit of the electronic information system,and its strong electromagnetic pulse effects have become the focus increasingly.As a kind of electromagnetic interference in the strong electromagnetic pulse environment,electrostatic discharge(ESD)has been the critical limit of reliability and electromagnetic compatibility for electronic information system.The effect of the electrostatic current on the integrated circuit may cause the failure of the hardware circuit or the loss of the efficacy,which may affect the normal operation of the whole system.Therefore,it is of great scientific significance to improve the performance and functional security of the information system by the analyzing and modeling of the transient interference effects.By using the time domain finite element method based on the discontinuous basis function and continuous detection function,the basic characteristics and the coupling effects of electrostatic discharge energy are investigated to fulfill the analysis on transient effect of 3D visual simulation and damage mechanism;A modeling method combining behavior and intelligence algorithm for the transient electromagnetic effect of the integrated circuit is presented,which can realize the intelligent extraction of the optimal parameters from the integrated circuit model and the efficient modeling of the electrostatic electromagnetic effects.Based on integrated circuit and comprehensive evaluation model,the quantitative and qualitative analysis method is used to implement the co-simulation of field and circuit for integrated circuit.In addition,the loss assessment,protection and optimization for the electrostatic discharge and electromagnetic effect are investigated.The specific work of this paper is as follows:1.The effect characteristics and coupling mechanism of electrostatic discharge model are analyzed.The transient model of electromagnetic energy coupling is established.Based on the electrical characteristics of different electrostatic discharge levels,the characteristic parameters of electrostatic discharge and its coupling in time domain are studied.Based on Galerkin finite element method,the time-domain coupling law is investigated,and the radiation coupling model and conduction coupling model of effective transmission is established according to the coupling mode of electrostatic energy propagation in different packaging structures of typical integrated circuits,revealing the characteristics of coupling effect for transient electromagnetic energy.2.The modeling method and technology of integrated circuit under electrostatic discharge are studied by using the electromagnetic sensitivity model of integrated circuit.The integrated power chip is investigated according to the behavioral modeling based on the Taylor series and the intelligent method based on particle swarm optimization modeling technology.Nonlinear characterization and modeling of integrated circuit under electrostatic discharge electromagnetic transient effect are delved,achieving rapid extraction and effective modeling for the optimal parameters of the integrated circuit model.The experimental and simulation results show that during the entire test period of 0-60 ns,the time domain simulation model and test model which can accurately characterize the electromagnetic sensitivity model are in good agreement,and the error is within 0.5V.3.The integrated circuit ESD protection strategy and effect evaluation method are proposed.In the ESD test environment,by using the modeling analysis method of the integrated circuit and the time domain transient method for field circuit collaborative simulation,based on the electrostatic discharge characteristics and coupling model,protective strategy study of integrated circuit on strong electromagnetic pulse effects is implemented.Finally,based on the effect evaluation criteria of integrated circuit,electrostatic discharge efficiency evaluation can be gained.The experimental results verify the effectiveness of the design for the collaborative comprehensive protection in improving the protection performance for the integrated circuit.After the system has been rectified and optimized,the protection degree has been enhanced obviously.