Application Specific Integrated Circuit Test Research In Memory Testing

This paper mainly discusses the test of digital ASIC. The function of research on ASIC,its function and domestic and international state are introduced respectively. An analog-digital, human-computer interactive method of testing and measuring is proposed in this paper, measuring scheme of ASIC products is built. In test system design section, the design of adapter is discussed. In the meantime, the software used for test system is analyzed in the section. The test of ASIC is explained in test section. By the test system, all parameters of the ASIC are tested according to the test procedure successfully. In addition, the aging experiment is adopted to improve the dependability of the chip with correct function. At the same time, the dependability is analyzed in theory.In this paper, the application of digital ASIC in the field of memory testing is also introduced. In the memory measurement system, the designs that include charge amplifier, analog filter, anti-jamming and so on are accomplished. The memory test system with HB0201 or HB0202 can effectively accomplish the sampling and memory of dynamic data independently. It can be used in various tough testing environments. The use of ASIC reduces the volume and power of tester, and moreover, its dependability is improved.In addition ,this paper research the way of using CPLD as control and compare their advantage with disadvantage .At same time, research directions are pointed out in this paper.