Development Of A Portable Operational Amplifier Comprehensive Parameter Tester

With the rapid development of China's integrated circuit industry,the application of integrated circuit chips is increasingly widespread.Operational amplifiers are often used in various circuit designs.How chip manufacturers ensure that the chips delivered to users are qualified before they leave the factory.The most important step is to test them to ensure the parameters of operational amplifiers.The number of index accords with the selection standard of the device in the hardware circuit design.This paper studies a portable integrated parameter tester of operational amplifier.In this paper,STM32 is used as the main control unit to realize the complex control function of the tester system.AD7606 and TFT LCD are used to complete the data acquisition and test results display.The user can read the data in real time and reduce the design cost.CPLD is used as the auxiliary control unit to realize the on-off scheme of the drive relay of the combinational logic circuit.The comprehensive parameter test module and the operation amplifier type selection module are designed to realize the selection of the test parameters and the operation amplifier type.A test method of auxiliary operational amplifier is proposed,which can realize the automatic and cyclic test of 13 kinds of integrated parameters(such as input offset voltage and input offset current),the different types of operational amplifiers(such as single operational amplifier,double operational amplifier and four operational amplifiers)achieve test.Each module communicates through bus connection,which is extensible for secondary development and portable.Comparing the measured value with the reference value of the existing test platform,the measurement error is less than 3%.The measurement data shows that the tester has high accuracy.The test parameters and object types are widely involved,which has a good role in promoting the integrated circuit test enterprises and universities to carry out the integrated circuit test related experimental courses.