Mixed-signal Ic Test The Accuracy Of The Optimization Method

ADCs are the most pervasive analogue blocks in electronic systems. With the advent of powerful digital signal processing techniques, ADCs are fast becoming critical components for system's performance and flexibility.Knowing accurately the parameters that characterise their dynamic behaviour is crucial, on one hand to select the most adequate ADC architectures and characteristics for each end application, and on the other hand, to understand how they affect performance of signal processing following.The main objective of the paper is to investigate and propose new test methods to improve test accuracy of Mixed-signal integrated circuits, which is strongly challenged by today's high resolution, high speed converters. The work of this paper is structured in seven main parts. The first one provides an overview of the most important ADCs' architectures and respective fields of application. Second part describes the generic architecture of an ADC test setup, and guidelines and best practice procedures are proposed in order to guarantee reliable test results. Then, the following two sections are devoted to the description of dynamic test techniques using sinewaves, respectively, sinewave fitting (time domain data analysis) and discrete Fourier transform (frequency domain analysis). These techniques are thoroughly described, as well as the fundamental mathematical background behind the equations to be used to obtain ADCs' characterization parameters provided in each case. Finally, a comparison between the two methods is presented.For mixed-signal integrated circuits, mainly the dynamic characteristics test methods of ADC, the completed works as following:1. Implementation Matlab algorithm of spectrum analysis method;2. Implementation Matlab algorithm of 3-parameter,4-parameter and improved 4-parameter sinewave fitting methods;3. Comparison of improved 4-parameter sinewave fitting methods and spectrum analysis methods. The results show that, for the low bits(8-bits) ADC, measurement precision (standard deviation)of two methods have little difference, but for high bits (12-bits) ADC, the sine curve fitting method improve the measurement accuracy significantly, especially in conditions not to ensure accurate coherent sampling.