Research On SIP Dedicated Chip Test Platform Based On Embedded Technology

With the rapid development of embedded technology,the embedded test platform has become the mainstream of the market.However,the existing test platform has many problems,such as single chip test,poor communication stability,too single test means,lack of error feedback mechanism and higher cost.The purpose of this research is to design a SIP chip-specific test platform based on embedded technology.The test platform is built by itself and adopts the man-machine interaction mechanism to test the SIP chip.SIP chip special test platform consists of TI6713 chip,TI6678 chip,SIP chip,Divine IV-ARM,host computer and expansion module.First of all,CCS software is used to complete the unit test and module test of all the underlying chips;the communication between the underlying chips is realized by using dual-port RAM;the inter-chip linkage test is completed;the data exchange between ARM and the underlying chip is completed through SPI communication;To complete the USB communication,to achieve the underlying chip and the host computer data exchange;the same time,ARM secondary verification to improve communication stability;program migration,the underlying chip with its own programming package to complete the programming of the target code,ARM Take the online programming;system testing phase,the host computer serial test,supplemented by LabVIEW-USB test;serial test is mainly through the serial port assistant to complete the bottom of the chip validation test,system testing;LabVIEW-USB test with Lab VIEW software The method of background monitoring is set up,the test information is recorded,the test process is set up in the man-machine interface,the test results are learned in real time,and the test accuracy is improved by using multiple test modes such as single item,comprehensive method and copy machine.Reserved chip expansion module for easy extension of product features and emergency backup.Through the SIP chip test platform,different types of chips can be tested and screened to reduce the development cost;inter-chip linkage testing can be implemented to make up for the gaps in the existing test platforms;the ARM secondary verification mechanism and various test modes of the host computer can be used,Improve test stability and test accuracy;with the background monitoring mechanism of the host computer,it is convenient for testers to understand the test information in real time;serial port and the test mode of LabVIEW-USB improve the practicability and market value of the test platform.