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Design Of Automatic Chip Test System Based On LabVIEW

Posted on:2014-01-25Degree:MasterType:Thesis
Country:ChinaCandidate:S JiangFull Text:PDF
GTID:2268330425461370Subject:Microelectronics and Solid State Electronics
Abstract/Summary:PDF Full Text Request
Chips must pass ATE(automatic test equipment)test before leaving factory. Whether ATE test is reliable or not will directly affect the yield rate of chips. To make sure ATE test program is reliable, every chip design company and manufacturer added Bench test into their quality control links. They built a test platform which is similar with chip real application environment. Bench test is usually completed by manual. When the chip number is large,it is necessary to build an automatic chip test platform to reduce the workload of manual testing.The birth of virtual instrument LabVIEW greatly promoted the test technology and test method. This paper built an automatic chip test platform for a power management chip of O2Micro company.(1) On the basis of analyzing the performances of power management chip and test requirements, the general circuit board and various ports which have strong compatibility were designed. The special circuit board only for one kind of chip was also designed. The production, communication and debugging of the two boards were completed.(2) The MCU communication program based on language C was packed into dynamic link library which can be called by LabVIEW. Controlling test instruments through personal computer was realized successfully with the help of instruments LabVIEW driver which was posted on the website.(3) The performance of analog power supply was corrected and promoted by using least-square method. The correction program was packed into dynamic link library which can be called by LabVIEW, which realized the combination between graphical language and text language.(4) The collected digital signal is filtering by using LabVIEW digital filtering technology, which eliminated the power frequency interference of data acquisition card and avoided the misjudgment of chip state.(5)According to the characteristics of test instruments and hardware circuit and chip testing requirements, the chip function test programs have been completed and promoted. The hardware platform and LabVIEW program was combined to debug and eventually the automatic chip test platform was completed. The chip test platform has the advantages of simple operation, high reliability and validity.
Keywords/Search Tags:LabVIEW, chip test, Bench test, automatic test instruments
PDF Full Text Request
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