C#Based Automatic Testing System For Reliability Test Of Multi-functional Chips

In order to do reliability testing efficiently and accurately in extreme environment,an reliability testing system composed of testing devices and environment devices is designed for T/R multi-function chips(MFC).Cooperating with a self-designed FPGA and a self-developed control chip is able to realize serial-to-parallel conversion of the control signal,which switches work states of chip easily and accurately.Software functions such as one-key set,automatic conversion of chip work state,automatic testing,data processing and storage,result analysis and report are also realized by synthesizing technologies of C#,visual programming,VISA,MYSQL and serial port communication.In addition,the testing system designs and processes a testing fixture according to the microwave cavity design technology,this fixture has good performance and has little impact on test data,which can satisfy the reliability testing in extreme environment Combined with a temperature testing system and environment devices,this automatic testing system is used for three temperature testing,dynamic life testing and anti-radiation testing.After testing,this system shows the features of conciseness,speediness and accuracy,which satisfies most reliability testing of multi-functional chips.