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The Test Platform Conscruction Of Mtm Fuse FPGA

Posted on:2019-07-28Degree:MasterType:Thesis
Country:ChinaCandidate:T XieFull Text:PDF
GTID:2348330569995401Subject:Engineering
Abstract/Summary:PDF Full Text Request
As a key development direction,in many countries,the field programmable gate array(FPGA)is becoming more and more strong for the area of aerospace,military,automotive and information communication,along with the AI emerging in the field of artificial intelligence recently,the FPGA will certainly play a more important role in the field of science and technology.But at the same time,the using environment of FPGA has become increasingly complex and serious,at present,on the market the common the FPGA chip mainly contains SRAM and FLASH,the two types of FPGA with different structures and configuration modes,but when they face some electromagnetic radiation,high temperature and high pressure environment,such as the external environment disturbance,they would be all shortcomings in terms of reliability,security,the data stored easily disorder,thus make the system failure,run to the unpredictable state.So you need to choose a kind of FPGA,which have high reliability,low power consumption,stable performance and the advantages of strong ability to resist radiation,and can resist the influence of the external environment,the fuse technology based MTM type FPGA using single programmable fuse unit structure,has great advantage in resistance to single particle events,is gradually applied military-industrial complex and important fields such as aerospace.Although the MTM anti-fuse FPGA have excellent stability,but the test is not applicable to the general test platform on the market,limited by test principle and test process,the fuse FPGA test need to the test platform provides a high level of multiple sets of voltage,and complete input and output the bit stream data,test information data,such as the test voltage and bit stream data,and chip timing requirements must be met.At present,the market have not a fully fledged test system can completely out of the limit of a field test environment on the PC,the anti-fuse test platform is commonly based on automatic test equipment(ATE)test platform,it is very expensive,so the traditional test system is not suitable for the anti-fuse FPGA,in this paper,the MTM FPGA need to a special test platform.At last,with a dedicated test platform composed of upper machine software,master drive circuit,and to test the fuse of the FPGA.Test bit stream data through the upper computer software will be loaded into the main drive circuit,and the main control drive circuit can output a high level signal,at the same time will receive the test bit stream data downloaded from the fuse in the FPGA chip,the high level signal with the bit stream data to cooperate with each other,and after complete the test,the results will be transmitted to the PC.Through introduces the features,the applied direction and the internal structure and internal resources of the anti-fuse FPGA,and also analyses the test principle,according to the circuit structure,then analysis of the test platform and the test requirements and test methods,finally based on MTM anti-fuse FPGA chip designed a test platform,the test platform with the STM32 chip as the core,completed the hardware drivers,and the design a PC software,and has a detailed explanation to the design,the testing platform would show an actual testing process and result to verificate if the platform meet the design requirements.
Keywords/Search Tags:FPGA, anti-fuse, bit-stream data, test voltage, test platform
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