The Research And Implementation Of Automatic Test For High Speed Differential Interface Chip

In recent years,with the great development of high speed devices the high speed ADC circuits get widespread applications,which put forward high requirement to high speed processing circuit behind ADC output.The high speed DMUX device which not only can reduce the transmission rate,but also can ensure data integrality when is used in data rate reduction after high speed ADC output,get wide range application in military communication field.The application of high speed DMUX chip greatly decrease performance requirement to processor behind ADC output,and design difficulty and cost of application system.However the high speed characteristics of DMUX chip put forward high requirement to testing.Further,with the wide range application of high speed intergrated circuit,the research to automatic testing technique and method which can saticfy performance testing and also batch testing is becoming more and more important.Based on the above reasons,High-speed DMUX device was selected as the studying object in this project.This paper detailedly analysis its structure,high speed conversion function,conversion mode,high speed interface characteristic,power supply characteristic and other circuit characteristics.This project designs a set of PCB hardware circuit which is suitable for this chip.The hardware not only meets the testing requirements of the electrical characteristics of the device,but also accord with the testing ability of the ATE.To high speed chip,it is used to custom-made high speed test socket for connecting chip and test board.In this paper,the design structure,plate and design rules of PCB board are introduced in detail.And the hardware test ablity,test card characteristics of ATE tester also are introduced detailedly.In this paper,the testing theory,testing methods and the test program development steps of ATE for digital device are introduced briefly.At the same time,the theory and method of high speed signal jitter test are proposed.At last,the principle and method of automatic testing are introduced.The focus of this paper is the automatic testing of high-speed digital signals bansed on ATE.Two goals need to be achieved.The first is the function and characteristic testing of high speed digital signal.The second is to realize the automatic testing of high speed digital device.For function testing,based on test vectors provided by the designer,ATE supply input signal and compare output signal.In this way,ATE performs functional testing and performes performance tesing after correct functional testing.For automatic test,the ATE and handler are required to be used together.By the GPIB communication interface,the handler receives instruction from ATE.The instruction is mainly the state of the device having been measured.According to this instruction,handler classifies the devices.The whole process is completed automatically according to the instructions.