Design And Dynamic Performance Testing Of 16-bit High-Speed Analog-to-Digital Conversion Circuit

As the connector between analog world and digital world, the performance of high- speed analog to digital converter circuit determines the performance of a whole electronic system. One characteristic of high-speed ADC circuit is that it is sensitive to niose, and its performance is determined by periphery circuit and PCB board. It is difficult to design high performance and high-speed ADC circuit. On the other hand, there are many factors could affect the high-speed ADC's dynamic performance. As Request to performance testing and assessing of high-speed ADC circuit in project increasing day by day, the technology for testing ADC's dynamic performance is being researched by researcher at home and abroad.Combining the lab's research project, basing on the 16-bit high-speed ADC LTC2204, this paper gives a solution of a 16-bit ADC circuit. This solution uses differential structure in the anolog input circuit and the clock input circuit, and makes some efforts in the groun- ding and bypassing of electrical source, which make it has good dynamic performance. It is worthy to be referenced in other designs. This paper also does some research of ADC test- ing theory via the frequency-domain analysis on the basis of performance testing method of the ADC device. An ADC testing system in frequency-field on the basis of DSP is given with its testing code. This system is simple and easily to be operated. At last, the high-speed ADC circuit is tested, and some results have been given out, which prove that the 16-bit ADC circuit solution has good performace and reach the goal of the research project. Then some analysis about the influence of some factors to the dynamic performance of the high-speed ADC circuit is maked, which could give some guidance to the testing and using of high-speed ADC circuit.