DSP Detection System Based On LabView

With the progress of integrated chip manufacturing technology and processing technology development, production and manufacturing the circuit structure is very complex, high integration, functional variety of DSP chip, has become not as difficult as before. But for this kind of DSP chip testing still exists many problems. This paper tests the DSP based on DSP + FPGA architecture.DSP chip is a kind of microprocessor with special structure.,Internal procedures and data separate,This structure is also called Harvard structure. DSP chip has two main advantages, one is the ability to deal with data, one is computing speed?DSP chip contains special DSP instructions, through these instructions can achieve a variety of digital signal processing algorithms ? DSP chip programmable with its powerful data processing capabilities and running speed, so it is widely used in many applications. In addition, DSP chip prices, cost-effective advantages, in the integrated chip manufacturing technology progress and production process, the production and manufacturing of those circuit structure is quite complex, high integration, features a variety of DSP chips, has become not as difficult as before, However, there are still a lot of problems for this kind of DSP chip detection, and the connection between the high degree of integration, the function of the DSP chip and the external circuit only through a limited number of pins to achieve, this will undoubtedly increase the difficulty of testing the DSP chip.Any a integrated chip is designed to accomplish a certain number of electrical characteristics function. For TI TMS320C6000 series DSP chip of XX effect test, is to detect the in XX effect test or after process due to defects in the process of do not conform to the requirements of the product.In view of the above problems, this scheme presents a TMS320C6000 series DSP chip of TI company in XX effect after test, to test the design method of test device, mainly from two aspects of electric parameter and function module testing.DSP is introduced in detail in this paper the effect of XX test device design and implementation process, and the appearance of the test device and the directions for use. Mainly includes the following aspects: the design of the test device background and significance, the references and terminology. Construction of test equipment requirements analysis. The overall design of the test device(including the system overall structure design and the overall function design). The key test device are introduced the hardware and software module design and implementation of the process. The appearance of test device display and directions for use.