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AMD APU Based DDR Controller Test Launch Up And Improvement

Posted on:2014-04-08Degree:MasterType:Thesis
Country:ChinaCandidate:F WangFull Text:PDF
GTID:2298330431971128Subject:Electronic and communication engineering
Abstract/Summary:PDF Full Text Request
As a key component of the computer, the memory has been affecting the evolutionand development of the computer’s processing speed and overall performance.so far themaxim data transfer speed of the best DDR3memory could reach2133MT/s. But the keyparameter of PC system performance is not only the DDR3performance but also theparameter "memory latency". From AMD K8series CPU (including Socket754/939/940interface, such as a variety of processors) inside began to integrate the DDR controller,DDR controller can effectively control the processor core operating at the same frequency,but also due to memory the data transfer between the processor without going through theNorth Bridge, which can effectively reduce the transmission delay. AMD Suzhou as themost important test site dedicated to effective quickly determine the merits of products,while ensuring the quality of our customers while effectively control production costs. TheDDR test for the latest AMP APU is quite important.APU is AMD’s newest main push of the integrated CPU and GPU chips, its internalDDR controller functions more powerful than the K8series of products that can supportthe fastest DDR memory, But no big difference for the qualify request. So the basiccontents of the tests can inherit the existing tests. then how to determine the test voltageand frequency is the most important focus before the test released to mass. That will notonly determine the quality and testing cost for AMD product, but also determine whetherthe test results accurately reflect the production of front-end obligations. This articledescribes the most important step in the semiconductor industry, product characterizationmethods and the whole flow for AMD APU.Although the test variance has been minimized based on the prod characterization,the test hardware differences, products characteristic fluctuations and test software bugswill cause changes in the test results. Closely monitor,timely detect and fast reaction willgrantee the AMD prod delivery. This article will introduce several cases from differentscenarios. And not only focus on the technical research, also based on the analysis of largequantities of test and how to make the proper decisions.In summary, this paper introduces the AMD APU based DDR controller test launch up and improvement.
Keywords/Search Tags:DDR controller, Test launch up, prod characterization
PDF Full Text Request
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