Multi-channel Electromagnetic Compatibility Test System Signal Amplification And Data Acquisition Circuitry Developed

In the operation of a large-current-pulse generating device, a strong electromagnetic pulse interference is brought about in the process of high voltage and large current charging and discharging, producing a serious impact on devices nearby. It is necessary to test the space eletromagnetic environment for carrying out the optimized design and verification of electromagnetic compatibility.The parameters containing electric field strength and magnetic field strength in different locations could be obtained simultaneously by using a multi-channel test system for electromagnetic compatibility improving the testing efficiency, which dedicats the specific characteristics of the electromagnetic field distribution.The result could provide a important reference for the whole electromagnetic compatibility. The signal amplification and data acquisition circuit is an important part of the test system,which is made up of data collection, amplification, storage.In this thesis, a multi-channel data acquisition and signal amplification circuit is made according to the need of electromagnetic compatibility test. The main work of the thesis includes:(1) The electromagnetic compatibility test system is provided along with the composition of each unit based on optical transmission under an environment of strong electromagnetic pulse;(2) A six-channel data acquisition and signal amplifying circuit is completed, comprising amplifier circuit, trigger circuit, analog to digital(ATD) conversion circuit, FPGA circuit, Ethernet interface circuit, clock circuits, power supply circuit, and schematic circuit design, PCB layout design and hardware debugging and test are all finished;(3) The software design is accomplished for the six-channel signal amplifying and data acquisition circuit, including:A/D control and interface module, DDR control and interface module, Ethernet interface module, and FPGA software programming, debugging, and test are carried through.(4) A test is carried out for the overall performance of the entire signal amplifying and data acquisition circuitry, which includes test of the dynamic range, channel isolation, effect bit of A/D. The result of the test shows that the circuit performance nearly meets the system requirement.