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Multi-Parameter Testing System For Optoelectronic Sight Based On Labview

Posted on:2015-03-16Degree:MasterType:Thesis
Country:ChinaCandidate:D Z ZhuFull Text:PDF
GTID:2268330425493365Subject:Instrument Science and Technology
Abstract/Summary:PDF Full Text Request
A testing system for Multi-parameter of optoelectronic sight is developed based on virtual instrument against domestic situation of optoelectronic sight parameter testing instrument. On the basis of the existing hardware, upper computer system is deveoped for the instrument via virtual instrument. The existing method of parameter measuring and detection equipment available in the market is discussed and analyzed, especially the mainstream method—the measuring method based on CCD machine vision and image processing. According to the experiment result, the measuring method based on CCD machine vision and image processing is simpler, easier to operate, and adapt to modern trends in intelligent instrumentation against traditional method. Most commercially available detection equipments can not simultaneously measure laser in two bands-visible and infrared. According to this problem, the hardware and upper computer software is designed to realize that one single instrument can measure divergence angle of two-band laser beam divergence angle. In the same time, we designed a indicating device to guide measured laser to aim at the centre of CCD.This system uses a motion utility--data acquisition card for the displacement data acquisition and motion control. The movement of the objective lens and the laser light intensity attenuator is controlled by motor and screw and worm and gear. The collected image data is saved to the computer’s memory via a images acquisition card. Using Lab VIEW graphical programming language to develop host computer program including Man-machine Interface and functional code, realized Data acquisition, processing, display, storage and motion control, ensured the system precision and efficient.
Keywords/Search Tags:LabVIEW, Machine Vision, optoelectronic sight, Multi-parameter
PDF Full Text Request
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