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Study On Mechanism Of Line-of-Sight Enhancement In Distributed Optoelectronic System

Posted on:2018-03-13Degree:MasterType:Thesis
Country:ChinaCandidate:T HeFull Text:PDF
GTID:2348330515487335Subject:Optical Engineering
Abstract/Summary:PDF Full Text Request
With the advancement of science and technology,the research of the line-of-sight of the photoelectric system has been carried out at home and abroad.For a single optical system,Change the hardware of the system itself and size of the sensor can effectively improve the line-of-sight of the system,But whether it is to change the system itself or to change the size of the sensor will be subject to material,testing,processing difficulties and other constraints,the line-of-sight has reached the limit of the existing level,it is difficult to go to improve.Therefore,distributed system has been proposed in paper to enhance the visibility of a single system.First of all,the research object is set to be two separate systems,the original image of the two channels were obtained respectively,Then the pretreatment of the image is proceed,Next,the image matching is processed by SFTF matching method,Improved SIFT matching method to match again to get better matching results.Secondly,the reconstructed image information is reconstructed from the pyramid image reconstruction method,and high resolution images are obtained.In this paper,Multi-sensor image fusion method based on ratio pyramid decomposition,multi-sensor image fusion method based on contrast pyramid decomposition,multi-sensor image fusion method based on gradient tower decomposition,and multi-sensor image fusion method based on pyramidal decomposition are compared.Finally,the reconstructed image quality is evaluated by both subjective and objective aspects.It is concluded that the spatial resolution of the reconstructed image is higher than that of the original image,and it is proved that the line-of-sight of the single photovoltaic system can be enhanced by the distributed photoelectric system.
Keywords/Search Tags:line-of-sight, SIFT matching, image reconstruction, Distributed optoelectronic systems
PDF Full Text Request
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