The Research Of Single-event Effects Mechanism In Phase-locked Loops

The PLL(phase-locked loop) is a automatic phase control system. The integratedPLL is widely used in frequency synthesizer, clock recovery circuit, etc. Due to theexposure to the radiation environment, aerospace electronic communication devices,particularly the PLL circuits maybe induced phase shift, and even loss of lock when theenergetic particle strikes a sensitive node. It will seriously disturb the normal operationof the circuit and system. Since1996Jobe firstly proposed a system-oriented singleevent effects test method in PLL, the SEEs(Single-event Effects) in PLL has become ahotspot of the radiation field of electronics in recent years.Although the overall structure of PLL is simple, the SEEs in PLL are extremelysophisticated due to the diverse response of the SEEs in each submodule and a mass ofcircuit nodes. This thesis estimates the SEEs sensitiveness among each submodule bysimplifying the single-event disturbance and analyzing the loops bases on thesimplification. And the circuit-level simulation analysises was implemented to researchthe complex failure mechanism of the SEEs in some submodules. This approachimproves the efficiency of the research in PLL and mixed circuit SEEs. It can provideestimation to the radiation-hardened by design in PLL. The mainly research work of thisthesis are as following.(1) Design the reference PLL. Elaborate mathematical models and parametersdesign of PLL. Design circuits of a self-bias CPPLL for research based on the SMIC130nm CMOS technology.(2) Model the SEE in PLL. Analyze the possible disturbance deriving from SEEsaccording to the characteristics of each sub-module circuit. Discuss the impact ofsingle-event effects to PLL loop by taking the disturbance into PLL loop analysis.(3) Implement the single-event sensitivity numerical analysis platform. Use theperl scripting language, design the numerical analysis platform to evaluate thesingle-event sensitivity of the PLL circuit. The platform includes the netlist resolutionmodule, the automatic simulation module and simulation data analysis module.(4) The numerical analysis evaluation experiments for the single-event sensitivity of the reference PLL. Take a reasonable circuit-behavioral level mixture structure toimprove the experimental timeliness based on the structural characteristics of thereference PLL. Analyze the experimental results both in extreme values and in statisticalvalues to quickly locate the sensitive nodes and assess the sensitivity of each module.