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Design And Implementation Of Programming And Testing Device Based On ARM For OTP Chips

Posted on:2014-02-28Degree:MasterType:Thesis
Country:ChinaCandidate:N B FengFull Text:PDF
GTID:2248330398965775Subject:Integrated circuit engineering
Abstract/Summary:PDF Full Text Request
HS3000P family chips are designed for applying to infrared remote control area, they are based on OTP(One Time Programmable) technology. There are a lot of characteristics of the chips, such as high-performance, low-power, wide operating voltage range, few components on the application circuits, easy to program and so on. They are widely used in development of infrared remote control area. In order to reduce cost, use inventory IC(Integrated Circuit) flexibly, improve production efficiency and help customers to program HS3000P independently, a powerful and specific programming and testing tool for OTP chips is essential. To meet HuaXin and its customers’requirements, this topic does a research on development of high-performance programming and testing device.This paper deals with development process of the system in several aspects, they are overall solution design, theoretical basis, hardware design and software design. First of all, this paper provides an overview of the design of overall architecture of the system in accordance with the requirements, and pointedly introduces the theoretical knowledge related to each module in detail to verify the feasibility of the scheme in theory. The second, this paper introduces the hardware design and principles of MCU module, power module, data memory module, programming module, testing module, communication module and interactive module. Third, the essay designs the program of each module with modular method and provides a brief introduction to the PC software. Next, I comprehensively debug the system and observe the signal timing of the critical nodes, then, the article compares it with expected result to validate the feasibility of the solution.In the end of the paper, it summarizes the work and puts forward some improvement measures for the programming and testing device according to the problems encountered during the debugging.
Keywords/Search Tags:Programming and Testing Device, OTP chip, HS3000P, ARM
PDF Full Text Request
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