Otp Memory Programming And Design Of Test System Technology Research

As the rapid development of the manufacturing technology, the design of ultra-large scale integrated has stepped into the ultra-deep sub-micron era. SOC (System on chip) has become feasible and popular. Memory which is the main medium of exchanging data and storing information has become more and more important in SOC chip. One-time programmable OTP memory is widely used because the data stored in it is nonvolatile and highly reliable. The program of the OTP memory requires special programmers. And the test of the OTP memory is essential. So the design of the highly performance programming and testing system is becoming more and more important.In order to program and test64Kb OTP memories, this paper design a test system based on STM32microprocessor. So we can avoid the use of expensive automatic test equipment. First, we analysis the64Kb OTP memories’function and timing, discuss the several basic failure mechanism of the memories and design the current detection circuit and the voltage selection circuit. Then the configuration of the input and output interface, system clock、USART serial communication and LED lamp is finished. An accurate delay function and PWM waveform generation function is designed. According to the timing requirement of OTP memories, the function for initialization、reading and programming is design. A single-bit program method is proposed. The platform can provide80I/O ports and7.5V programming voltage. The maximum working frequency of this platform is32MHz. This platform is very suitable for the programming and testing of the OTP memory.Finally, based on the programming and testing system, the function of the64Kb OTP memories is verified. The problems and defects in the design of the chip are found. And the solutions are also proposed.