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Research On And Design Of Electrically Programmable Fuse (E-Fuse) On Ultra Deep Submicron

Posted on:2014-01-02Degree:MasterType:Thesis
Country:ChinaCandidate:Y Y WangFull Text:PDF
GTID:2248330398464776Subject:Microelectronics and Solid State Electronics
Abstract/Summary:PDF Full Text Request
E-fuse (Electrically programmable fuse) is widely used as a redundanttechnology in ULSI (Ultra-large scale integration). This thesis designs a4k512*8PIPO E-fuse storage circuit,256output signals is realized using twogroups of8data in different time controlled by a pair of amplifiers. Theamplifier is constructed using cross coupling differential pair with4referential trim resistors. These resistors can be trimmed to accommodatetechnology fluctuation. The delay module and bit line driving circuit aredesigned as well.The design is optimized considering area, power, and velocity. A newcell structure is proposed. Its performance of is discussed comparing withtraditional structure. The circuit can be operated in a wide range, withvoltage from1.0V to1.4V and2.8V to3.6V, temperature from-40℃to-125℃. It is verified under TT,FF,SS,FS,SF corner, with minimum powerconsume11.5mW,reading current less than1.1mA. The programmingcurrent is larger than16mA, which can guarantee the triggering of the fuse。Simulation results show that typical programming current is19.5mA,delay is less than2ns, flip time is less than1.5ns. The chip is realized using HUALI55nm standard CMOS logic technology. Tapeout data is presentedat the end.
Keywords/Search Tags:E-fuse, Ultra Deep Submicron, CMOS
PDF Full Text Request
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