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Research And Design On The Measurement System Of Laser Beam Power Distribution

Posted on:2014-01-07Degree:MasterType:Thesis
Country:ChinaCandidate:Y F LiFull Text:PDF
GTID:2248330395487211Subject:Control Engineering
Abstract/Summary:PDF Full Text Request
With the development of technology of semiconductor, the tunnel effect technology make plane array semiconductor laser power is more and more big, together with semiconductor laser has small volume, light quality, photoelectric conversion efficiency, long service life and easy to direct electric adjustment etc, in scientific research and engineering fields have a very wide range of applications, this is incomparable for other laser devices. But semiconductor laser have linear surface plane which give out linear light, many linear light source accumulate into surface light source, in vertical and parallel to the surface plane have large Angle difference, which led to the space distribution of the spot into an oval, beam quality is poor, light energy utilization rate is low. So in many application fields, use optical means beam shaping, multiple beam synthesis, to obtain a higher power, spot the better the homogeneity of semiconductor laser light source. This needs to accurate the facula power density distribution of the semiconductor laser for screening laser device, and giving advice for optical designIn this issue, a circular detection unit is constituted by photoelectric diodes, each detection unit convert photocurrent from the photoelectric diode to voltage signal linearly, using I-V circuit respectively. Then acquire the voltage signal. The technology of synchronous acquisition and time sharing output is used in the process of analogy to digital. This is helpful to reduce the deviation caused by the change of output light in a signal acquisition.This scheme has the advantage of real time data in the test of laser beam power distribution, get ride of the influence of slow acquisition speed and source change, the data acquiring and processing work automatically, which is helpful to have more efficiency.The test device can adapt to different beam size and test position measurement when equipped with precision shift mechanism, which have more generality.
Keywords/Search Tags:semiconductor, laser power density, photoelectric diode, peak keep
PDF Full Text Request
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