Study On The Technology Of Power Measurement And Calibration Of The Narrow Pulsed Semiconductor Laser

The most obvious characteristics of narrow pulsed semiconductor laser diode (NPSLD) were narrow pulse width, high peak power besides features such as small volume, light weight, high efficiency and reliable performance of semiconductor laser diode (SLD). Laser fuse and laser guidance is the main application field of NPSLD. So we studied on the measuring system for peak power measurement and the efficient calibration to ensure data reliability.This paper firstly compared the common peak power measurement, designed suitable measurement according NPSLD's own characteristics and chosen the key equipment (narrow pulsed driver source, photoelectric detection system and oscilloscope) constructing the measuring system.Secondly, We traced to the source of laser power and energy standard and studied two calibration methods for this system by using the direct proportion of voltage and the peak power. Then we overcame the disadvantages such as floppy disk memory consuming time and missing data of the second calibration method by using PC controlling and programming by VEE visual software of Agilent corporation. And further, we described the program in detail for area integration using VEE.At the end, we used different methods and collected lots of data to calibrate the calibration factor k of this test system by two pulsed semiconductor laser thatλis 900nm, pulse width are 200μs and 200ns.The combined standard uncertainty of two calibrations were 4.70% and 3.01% respectively, which meet the predetermined parameter less than 5%. According to analysis, we can draw the conclusion as follows.(1)Type A uncertainty was caused by measuring data repeatability which was inevitable but it had little effect to measuring result. (2)Type B uncertainty causing by instrument can decrease by using higher precision instrument instead. (3)Other Type B uncertainty can reduce by designing better method, avoiding artificial operative errors and so on. Moreover, this paper pointed out that influential factors of errors in measurement and calibration and proposed improvement measures.