High Reliable Microwave Solid State Power Amplifier Limit Assessment Technology Research

A new method of rapid evaluation to electronic components with high efficiency, short cycle, low cost has developed rapidly, and has important applications in quality assurance system of electronic components for space application. This technology already has some research foundation overseas, we advance the concepts, methods and technological process for the domestic limit assessment test technology (LATT) of electronic components for space application, and the microwave solid state power amplifier is used for experimental verification.We study the basic theories of the LATT and analyze the applicability of the proposed limit state mathematical model. According to different demand, four limit concepts including absolute maximum ratings, inherent limit, available limit and damage limit are defined to evaluate ability of the electronic components. After summarizing the critical technology of LATT including the analytical approach of sensitive stress, sensitive parameters and common fault models, we design the LATT project used in evaluation of microelectronic device.A certain GaAs MMIC power amplifier chip is chosen for the temperature stress step experiment, working voltage step experiment and temperature impact experiment with appropriate testing programs and testing platforms. The burnout failure in voltage step experiment is analyzed and the results prove the concepts of LATT to be reasonable and available. Some improvements of material and process are proposed, which verifies that the LATT is useful. The achievement has applied for a patent and is used in the actual standards application of electronic components for space application.