High-power Analog Integrated Circuits Dc Parametric Testing And Implementation

With the rapid development of the integrated circuit (IC) industry, ICs have became more and more integrated, the internal structure of IC becomes more and more complex. IC test technology as an important method to make sure IC quality develops very rapidly. DC parametric testing is an important component of IC test, it has got more attention from IC test industry, because it could detect the performance of the IC quickly and efficiently. In this paper, a high-power DC parameters of the test device has been researched, which could achieve high voltage, high current DC parametric test with high test accuracy and with universal.Based on the studying literature, firstly the background and significance are analyzed and researched in this paper, and the IC test system's components, classification, and state of development at home and abroad are introduced. We introduces the basic principles and methods of IC test, based on the work the design requirements of the test of high-power DC parameters has been given. Design blue print of DC parameter test device of high-power analog IC. Secondly, the interface control module, logic control module and precision measurement unit(PMU) of the device are presented. The paper mainly elaborated on the working principle of precision measurement unit, and building the hardware circuit. Thirdly, We design the test driver functions, which provide an interface to programmable test. Finally, We analyzes the principle and method of the testing of integrated operational amplifier. It shows that this is suitable for practical applications.The test device has been used in a Semiconductor in Guangdong province. Its operation shows that it is stable, versatility, low cost. And it has high practical worth.