Memory Test Methods And Test Procedures To Achieve

The test of VLSI is increasingly difficult with the use of VDSM technology. Chip testing especially memory testing meets unprecedented challenges, and it has become a bottleneck restricting the development of the whole industry .With the people become aware of the importance of the components reliability, many big test systems are introduced into China. But the systems are short of programs and adapters, and the unities have little peoples who know both the systems and the components, so the systems are used seldom.Firstly, the dissertation introduces the actuality and trend of memory, test systems and the test technology of memory. The paper describes The work theory ,failure mode and fault mode of memory are described. Secondly, study the test methods and algorithm of test generation of memory is studied. The algorithms are described according to the relations between test pattern graphics'length. These algorithms are different in the complexity and fault overlay; we can properly select one of them in our case. BIST technology will become the main test technology of IC, the development of BIST is an important task in VLSI manufacturing.Finaly, in order to make up the lack of the test system, we study the test theory and use it on the system. We exploit some test programs and adapters and settle some difficult problom in quality test of memory.The experimentation results show that the memory test programs satisfied the request. It settled the problem in engineering.The solutions also acquire research benifits and economic benifits.