Research On Memery Test Technologies And It's Application In Quality Testing

The quality of electronic component, especially memory, is related to the reliability of electronic equipment. All the components, indluding memory, should be tested before they are set on a system. But the test of VLSI is increasingly difficult with the use of VDSM technology. With the attestating of Quality System, many big test systems are introduced into China. But these systems are short of programs and adapters used in quality test.First, the paper introduces the actuality and trend of memory and the test technology o f m emory. The p aper d iscusses m ostly o f configuration, classify and fault mode of memory. Secondly, study the algorithm of test generation of memory, including marching, walking and row walking. These algorithms are different in the complexity and fault overlay. We can properly select one of them in our case.Besides, discusses the application of BIST in memory test. BIST technology will be the main test technology of IC, not only in memory test. With the development of macro electronic technics and communication, the number of memory, CPLD, CPU, DSP is increasing. The quality of them is more highly demanded. But test cost is increasing with the popularization of SOC. In order to keep lower test cost, the test in future will be BIST test entirely. The BIST test technology has shown its superiority in memory test by using it combined with scan test technology. The development of BIST is an important task in VLSI manufacturing.Finnaly, in order to make up the lack of the test system, we study test theoryand use it on the system. We exploit a lot of test program and adapters and settle some difficult problom in quality test of memory.The experimentation result showed that all the handreds of Memory test programs satisfied the request. It settled the problem in engineering. The solutions also acquired research benifits and economic benifits. One of the ministries praised it.