Testability Algorithm Based On Multi-signal Model Of The Electronic System And Software Design

More complicated electronic systems become, more difficult fault diagnosis becomes. To reduce the difficulty of electronic system testing, testability need to be considered in system design stage and included into design standards. Then analyzing the testability of the designed system makes sure whether the design requirements are achieved. System testability started late interiorly. Then both knowledge system and immature simulation software for testability design are imperfect. Therefore studying system testability in depth and developing the corresponding software platform are significant.Multi-signal model, testability indicators system, distribution methods and analysis methods of indicators are researched in this paper.The objects of distribution and prediction methods are fault detection rate (FDR) and fault isolation rate (FIR),while the other indicators(redunant test,ambiguity groups,hiden faults,masking faults and so on) are analyzed with the dependency matrix.Based on the research of distribution and anticipation, distribution and analysis functions of DFT-aided design and analysis software combined with COM technology are achieved. The platform can provide fuctions of indicators distribution, indicators analysis, generating optimal test sequences and so on for the electronic system. Experiments on the use of the platform as well as the foreign TEAMS software in the electronic system testability are presented, and the results show the correctness of the algorithms are given in this paper.