Testing Parallelism Enhancement Of Freescale Microcontroller MC68HC908GR8 Series

Freescale Semiconductor is a leading global semiconductor company focused on the networking, automotive, wireless communications, industrial control electronics markets, and providing embedded processing and connectivity products to large, high-growth markets. Freescale is responsive to the customers'needs and committed to deliver the highest quality embedded semiconductor solutions to their customers. She uses Six Sigma as her process improvement methodology to achieve the customer's and their business objectives. MC68HC908GR8 series is a new 8 bit micorcontroller extended by Freescale and for substituting the M68HC05 series microcontroller. It was specially designed for the low power and System on chip in automobile electronics.Testing is very important in MC68HC908 micorcontroller series manufacture flow. The increasing complexity of MCU devices demand more in testing and take a high limit for reducing testing cost. Generally speaking, Chip manufacturer reducing test cost through several means listed below: 1) Reduce the test time by new test techniques; 2)Increase testing parallelism and throughput; 3)Increase the utilize and working time by improving test agility and expansibility.Starting with increasing the test system's parallelism, combining digital circuits'test theory and Teradyne J750 test system's principle, we redesigned the×8 loadboard , modified the test program , enhanced the test parallelism of MC68HC908GR8 series from 4 to 8. At the same time, I solved the low yield issues of GR8 A/D module and LVI module, elevated the working efficiency.Correlation experiment proved that the parallelism enhancement project is eligibly reviewed by reliability and engineering design theory. Improved test system can satisfy the request in high parallelism testing.The MC68HC908GR8 parallelism enhancement project not only save the test resource but also depress the test cost. This project made a great contribution for the 50% gross profit of Freescale Semiconductor in 2006 and improved test systems have been on stream since October, 2006.