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Testing Technology Study Of Subscriber Identity Module

Posted on:2009-06-14Degree:MasterType:Thesis
Country:ChinaCandidate:Z T LiFull Text:PDF
GTID:2178360245969971Subject:Computer application technology
Abstract/Summary:PDF Full Text Request
The security of telecommunication becomes more important because of the rapidly developing mobile telecommunication service. Subscriber Identity Module (SIM) which is a kind of smart card used in mobile telecommunication area was invented for that. Now, as the replacement of SIM in 3G system, USIM will transit gradually to a multi-application platform, and play a more important role in mobile telecommunication area.The author and his task group have taken up with the research of testing technology and testing tool development of SIM and USIM for a long time. During graduate phase, the author took part in the project titled "SIM/USIM Testing Platform Design" sponsored by DMT. Supported by the project, this thesis studied the testing technology of Subscriber Identity Module. After theoretical analysis and engineering implementation, some contributions are acquired, which are including:1. The basic knowledge and testing technology of Subscriber Identity Module is analyzed. A testing procedure model based on its life cycle is founded, which can improve the connection between manufacture and test.2. The chip test and COS test of Subscriber Identity Module is studied. Testing schemes for chip's wafer and packaging test are designed. An incremental testing method and automatic testing model is founded based on the contents and environments of COS test.3. The standard protocol of Subscriber Identity Module is analyzed. The contents and methods of SIM protocol consistency test are studied. And the testing contents, related protocol and testing environment of USIM/ME interface consistency test, Cu interface USAT test and USIM consistency test are introduced and analyzed.4. A testing platform for both SIM and USIM is designed. We can achieve the function of reader, tester and waveform observer by this platform. By use of these functions, the work of Subscriber Identity Module can be simplified and the test efficiency can be improved.
Keywords/Search Tags:Smart card, SIM, USIM, COS test, wafer test, MP300TC2
PDF Full Text Request
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