Improve Test Efficiency Of The New Program

Since the first transistor been created in 1948,semiconductor technology was developing by big step following the Moore law all along.But the IC test technology development lag behind the semiconductor technology always.In china,the IC test efficiency is low in many IC test company.There is two factor cause the low test efficiency.They are high overkill and low efficiency of overkill troubleshooting which been complained about by client always.Also,the low efficiency is the most factor for desire of IC market. So,test efficiency improvement is very necessary.Firstly,this paper will introduce the IC test elements which is the foundation of how to recognise the various overkill.Secondly,this paper will introduce the ATE and others hardware knowledge which is necessary for overkill troubleshooting.The last,the paper will study the scheme of test efficiency improvement base on the efficient troubleshooting of open test overkill.This paper will show the difference between new and old overkill troubleshoot-ing flow by adopting the flow chart. Will analyse the overkill by adopting statistics.Will analyse how to find the real cause of overkill by adopting 5-why method.Will introduce the anastrophe study how to repair Pin Card.Will show the improvement of new scheme comparing with before.In this paper,the improvement of new scheme will show at below several side. Shorting the time of troubleshooting.Increasing the test yield.Reducing the test cost.