ATE Test Solution For RFID Device

RFID devices are becoming more and more popular in China in recent years, especially in the fields of industry and commercial automation, transportation management, etc. However, it is still a big issue when talking to the ATE test solution due to its special RF function test and data transfer format. This paper focuses on a set of solutions to several most difficult test issues based on common SoC ATE without expensive hardware configuration. It will introduce only the digital resource of an ATE, plus application test module to simulate the RF function of these devices. Not only the evaluation but also HVM can use this solution to realize real low cost test. Meanwhile, it has very good flexibility and compatibility compared with all other existing solutions.