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The Study About Dynamic Test Technology Of High-Speed-ADC Based On DSP

Posted on:2008-07-30Degree:MasterType:Thesis
Country:ChinaCandidate:D J XuFull Text:PDF
GTID:2178360215990849Subject:Microelectronics and Solid State Electronics
Abstract/Summary:PDF Full Text Request
High-speed analog-to-digital converters (ADC) are widely applied in video,wireless communication and military arena etc.They have quite a number of application demands.In order to manufacture efficiently high-speed ADC that has good performance,how to evaluate the performance of high-speed ADC accurately and quickly is very important.ADC testing includes static testing and dynamic testing.It is difficult to evaluate the dynamic performances of high-speed ADC truely and completely to adopt tranditional static-testing methods.In order to test and access the high-speed ADC,the dynamic testing methods based on digital signal processing(DSP) such as the code density histogram analytic method and frequency-field dynamic analytic method are adopted widely at home and overseas.After reading lots of high-speed ADC performance testing methods ,the author deeply analyzes and studies code density histogram theory,frequency-field analytic theory,window function technique,coherent sampling technique and high-speed ADC testing methods etc.According to testing status at home and overseas,especially lack of hardware and lag of testing technique at home,combining with pre-studying high-speed ADC dymamic testing station ,the author designs and builds a suit of high-speed ADC dynamic testing station that can be operated easily based on PC,DSP,FIFO,realizes preliminarily dynamic testing to high-speed ADC.Using this dymamic testing station,two types of high-speed ADC that are 10_bit AD9050 and 8_bit AD9480 are tested by the code density histogram analytic method and frequency-field dynamic analytic method below 50 MHz. Test results indicate this design strategy is feasible and portable.It is very fit for performance testing of high-speed ADC chip in the project assess.
Keywords/Search Tags:High-speed ADC, Dynamic Testing, Digital Signal Processing, The Code Density Histogram Analytic Method, Frequency-field Dynamic Analytic Method
PDF Full Text Request
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