High-Speed Analog To Digital Conversion Circuit Dynamic Performance Testing

With performance of high-speed analog to digital converter constant to rise; application of high-speed analog to digital converter circuit deepens in digital signal processing, software radio and radar. Request to function test and assess of high speed A/D circuit in project is increased day by day. This paper give some important definition of parameter of high-speed analog-digital circuit dynamic performance and do some research of A/D testing theory via the time-domain and frequency-domain on the basis of performance testing method of the A/D device. An A/D testing theory in frequency-field on the basis of digital signal processing is given. This method is simple and has suitable precision testing. It is very fit for performance testing of high-speed A/D circuit in the project assess. In this paper design of some circuit including in A/D circuit is also analyzed, such as front analog circuit, sample clock circuit and data flip-latch circuit. Find out the fact reducing a high speed A/D circuit performance. Such as harmonic distorted in front analog circuit, sample clock shaking, analog power and the noise in ground plane etc. Some suggestion of circuit design is given to improve high-speed A/D circuit performance. Those include power supply circuit design; ground plane design and sample clock design. Combining some radar development, its high-speed A/D circuit is tested, and has given out some test results.