The Aging System Design For SM-PDP

Plasma Display Panel technology has established its important position in the high-definition and large-screen display fields when coming to 21 century. Comparing with current ACC-PDP, the shadow mask PDP (SMPDP), which is invented by Southeast University NANJING PRC, has many advantages. For example, the technics flow of SMPDP is simple, the yield is high and the cost is low, etc. Southeast university has own its full intellecture property, so it is hopeful to become an important way to develop Chinese PDP.In the process of PDP manufacture, aging process is a very important step between panel manufacture and video display driver. The purpose of aging process is to reshuffle the MgO, and redistribute any carbon, water and CO2 contamination, and create oxygen and magnesium vacancies, so that the firing voltage becomes uniform and low over the whole panel. By far, the international research about aging process is all aimed at ACC-PDP, and there is no aging test system and test criterion for SMPDP. For satisfying the aging requirement of SMPDP, it is necessary and urgent to create an integrated SMPDP aging platform and test method.After analysis and comparison of actual aging requirement for SMPDP, a scheme of SMPDP aging circuit system has been proposed in this dissertation. The driveing wave and energy recovery circuit (ERC) for aging system are different from SMPDP video display system. The EMI/EMC principle has been considered to reduce interference and improve the stabilization of system in our circuit system design. After a series of tests, it has been proved that our aging circuit system can fulfil the aging process of SMPDP under stable working status, and it has an excellent compatibility to adapt to the large-screen panel, high sustain frequency aging course.Based on this aging circuit system platform, the aging process of many panels have been tested and analyzed. The characteristics of SMPDP during the aging process have been investigated and finally a reasonable aging test method and test time has been determined.