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Complex Programmable Logic Device Detection And Analysis

Posted on:2012-07-29Degree:MasterType:Thesis
Country:ChinaCandidate:C C YinFull Text:PDF
GTID:2178330338953707Subject:Microelectronics and Solid State Electronics
Abstract/Summary:PDF Full Text Request
As China's rapid development of digital integrated circuit industry, the digital IC testing and service role in the industrial chain will become increasingly large. Specialized digital integrated circuits (IC) IC testing industry is an important part of the industry, from product design, processing the whole process start to finish, providing qualified product to customers is done by testing. The development of the integrated circuit IC testing is important, not only to ensure system reliability and reduce system cost. This article describes a series of 100-pin CPLDXC9500 chip test program. One bale: A hardware and software project test plan, writing test procedures, introduced the integrated circuit tester-based testing principles and methods, including the electrical characteristics of functional testing test principle and the principle of detailed description of the test methods and general Comparison of some of today's popular special test methods for the common failure analysis. By reading this paper, readers can understand the test in an important position in the development of integrated circuits, a simple understanding of the project from the beginning of testing digital integrated circuit design to final completion of tasks related to the process of testing, knowing CPLD9500 system structure and principle of the chip, about the integration circuit tester and test theory and test the associated test methods. Hope that this will allow more people to learn more about the test of integrated circuits, adding to the industry to.For test engineers, test different for the same project engineers will design different testing methods, the underlying principle of compliance is to save testing costs, save time, guarantee the success rate of the chip at the same time, create more economic benefits. With this purpose in mind, I tested under CPLDXC9500 standards, with the Verilog HDL file editor for the design of a new program, the program includes 16-bit counters, buffers and trigger design. This new program not only has the standard on the CPLD chip all the functions required, and the program is simple and practical. To test the machine has laid a good foundation.In accordance with the chip CPLDXC9500 test standard, the exchange parameters during the authentication chip, the chip should take an external resistor and capacitor consisting of two peripheral circuits. I am doing CPLDXC9500 chip communication parameter validation, there is no practical external circuit, but through the J750 tester poured directly on the output pin or the output current to achieve the external circuit to achieve results. Such improvements not only save the device and easy to debug, fundamentally save time and money.During Tplz test is OUT1 high impedance logic 0 to the delay out of the test machine can not directly test, the tester needs a subtraction, to get OUT1 high impedance logic 0 to the delay, so that during high-volume chip test will be a waste of time. In this paper, the application of Visual Basic language to write a logic 0 on the OUT1 high impedance delay tplz = tplz90-tplz10 program to connect directly through the J750 tester, test the line subtraction automatically, saving the test of time , also avoid manual testing the tester.
Keywords/Search Tags:Digital integrated circuits, Test of digital integrated circuits, CPLD, Test measure
PDF Full Text Request
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