Digital Integrated Circuits Automatic Test Hardware Technology

With the development of economy and progress of technology, Integrated Circuit industry has got great achievement.IC test play a great role in IC industrial chain,IC test makes sure IC has good performance and quality.IC test is a supporting technology in IC industry, and the Automatic Test Equipment (ATE) is a tool which completes the IC test.Based on the above description, as an opportunity of this subject, carry out development of a digital IC ATE that is in order to shorten with foreign technology in the IC test industry. The subjects developed a digital IC ATE which can basically meet the demand for digital IC test. In addition, the digital IC ATE with a user-friendly, pratical, relative inexpensive, etc., which can reduce significant cost for IC manufactures.Firstly, I relate the research of Automatic Test Equipment at home and abroad, discusse the technical difficulties faced by IC test, and the digital IC test technology which includes function test techniques and DC parameter technology. The logic function test technology presents the test waveform generation and output of the device under test sampling; the DC parameter test descries the test methods of the open short and input leakage current and output voltage.In the chapterⅢandⅣof the paper, I explain the detail in the design principle of digital IC test board which is the core component in the digital IC ATE. In the digital test board, there three main parts composes of the logic function test: the SRAMS which store test patterns and result of test; the design of the logic control unit based on the Field Programmable Gate Array (FPGA); Pin Electronic (PE).The DC parameter test contains a digital to analog converter (DAC) and Precision Measurement Uites (PMU) and a analog to digital converter (ADC).In the last part of the chapterⅣchapter, I also present the calibration process in the DC parameter test unite of digital IC test board.In the last part of the paper, I explain a test design for a typical IC device, and gets the results. In the design experiment, the digital IC in accordance with specification is tested the logic function and DC parameter in the development of the digital IC ATE.In the logic function test, test patterns run the maximum test frequence of the digital IC ATE, then carry out five DC parameter test items. All of them have been adopted. The experiment verifies that the development of digital IC ATE meets the digital IC test requirements.