Study Of DC Bias Technology Based On Infrared Focal Plane Arrays Measurement

In recent years, with the development of the IRFPA, the technology of the infrareddetection and system is used in the military affairs extensively as well as daily life andso on. In this context, the necessity for manufacturing a system for the infraredmeasurement is needed. The key technology is for the ability to realize the DCbias .But the whole world don't make a great breakthrough to it. This paper mainlyintroduces the DC bias technology which is used in providing voltage to the infrareddetector directly.This paper mainly talks about the work as follows:1. On the basis of reading a lot of references, the paper introduces the concept andprinciple of the IRFPA. Then the paper talks about the development of the IRFPAnowadays and the theoretical research gap from the domestic research to theinternational research.2. This paper introduces the main performance parameter of the IRFPA in detail,and introduces the general requirement, the structure as well as the key technology forthe system.3. This paper takes a theoretical analysis to the influence which is between the DCbias and the system of the infrared measurement. By taking into account the definition,inhibition as well as the environment of the noise, the paper presents main performanceparameters of the DC bias. Of course, the paper also discusses the performanceparameter, noise analysis, the EMC technology and accuracy requirement integrally.4. This paper designs the hardware and software by considering the actual demandfor the DC bias. And we also take simulations to some chips for their noise, functionand arithmetic.5. This paper introduces the actual result for the DC bias, summarizes somequestions which appear in the process of using the instrument. At the end, the papersuggests some related advice and feasibility planning for the further work.