Improvement Of Back Logic Circuit Of IC Test System And Research Of Analog Delay Line Capability

IC (Integrated Circuit) test is important to the development of VLSI. It plays an important role in not only ensuring the system reliability but also reducing the system cost. The research of IC test system is a key part of IC test industry and the research and production of a sophisticated test system is of great importance.Some important problems in the development of IC test system are discussed in this dissertation. First based on the analysis of the architecture and development of IC test system, the back logic circuit of IC test system is discussed. Analog delay line is used to decrease the delay and the technique of pipeline is used to improve speed of the back logic circuit. Then the ability of the key component of timing circuit, analog delay line, is probed. The timing resolution and the influence of voltage disturbance, temperature and non-linearity on the timing precision is analyzed. A conclusion that the timing precision of analog delay line is difficult to be improved is reached. Then an experiment is followed to verify this conclusion. Finally with CAD tool PSpice the emulation of analog delay line and some improvement of comparator is implemented.It is proved that the improvement scheme of back logic circuit is effective and can increase the system speed. Analog delay line can have a...