Research On Single Event Effects Monitoring Methods And Monitoring System Of FPGAs Used In Spacecraft

Since the benefits resulting from the high gate density and unlimited reconfiguration ability of the SRAM-based FPGAs,the development cycles of complex logic circuits have been shortened, so the SRAM-based FPGAs have been used more often in spacecraft as before. Unfortunately, the FPGAs used in spacecraft are susceptible to radiation induced faults, such as single-event upsets (SEUs),so it's necessary to do accelerated ground testing to verify the reliability of the chip which has been chosen.This paper is based on the research results of domestic and foreign,and developed a simple single-event effects ground testing monitoring program combined with the structural characteristics of SRAM-based FPGAs. This program includes dynamic SEU testing, static SEU testing, single-event latch up testing and single-event function interrupt testing, as well as a variety of configurative methods with these testing. A preliminary design plan for monitoring system, as well as designing and simulating the slave computer are presented in this paper. These can meet the basic function requirements of single event effects ground testing.