Keyword [ATPG] Result: 41 - 49 | Page: 3 of 3 41.  Timing-oriented approach for delay testing and dynamic timing analysis 42.  Reducing digital test volume using test point insertion 43.  A novel algorithm for improving the diagnosis resolution of VLSI circuits 44.  Advanced test generation techniques: Improving yield and protecting intellectual property 45.  Testing and verification by exploring circuit properties 46.  A new ATPG algorithm to generate compact test sets which detect static and dynamic defects in VLSI circuits 47.  Strategies for high-performance test generation 48.  Research And Implementation Of Low Power DFT Based On Scan Chain And ATPG 49.  DFT Implementation And Physical Design Based On 28nmDDR PHY   <<First  <Prev  Next>  Last>>  Jump to

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