Single Event Upset Directional Injection Method For Kintex-7 FPGA And Its Simulation Verification

SRAM-based FPGAs are widely used in satellite remote sensing,deep space exploration and other space fields.Affected by high-energy particle radiation in complex space environment,SRAM-based FPGAs are prone to SEU(Single Event Upset),which causes bit flip in the configuration RAM memory cells in FPGAs,resulting in system dysfunction.Anti single event upset technology,such as dynamic refresh and triple modular redundancy,has attracted much attention.Quantitative directional injection of single event upset is the key to verify anti single event upset technology.The existing means of groundbased high-energy radiation testing and satellite-mounted verification are costly and make it difficult to achieve single event upset injection into designated areas.Therefore,this paper studies a single event upset directional injection method for Kintex-7 SRAM-based FPGA,where faults are injected into the configuration bits in the FPGA to simulate the SEU phenomenon in a real space environment.The specific contents are as follows:Firstly,for SRAM-based FPGAs,the configuration RAM memory cell determines the logic function of the user circuit.To tackle the issue of unknown frame structure in the configuration memory,the frame structure of the configuration memory is studied and a method for analysing the configuration frame structure is proposed.After obtaining all the frame address data through the ICAP(Internal Configuration Access Port),the frames are further parsed according to the different frame address types and the configuration frames corresponding to the configuration RAM resources for Kintex-7 series FPGA devices are finally extracted.Finally,to address the problem of the large number of configuration bits and the large proportion of non-critical bits in the configuration RAM of Kintex-7 series FPGA devices,which makes it difficult to achieve single event upset directional injection of specified functional modules,a method of automatic configuration memory fault injection based on the essential bits technology is proposed.1)Extract the essential bit data file corresponding to the specified function module from the configuration bitstream file;2)Convert them into fault injection addresses.Then a bit flip occurs at a specific location designated by the fault injector to achieve single event upset injection.To verify the proposed method in this paper,a series of experiments are carried out in a spaceborne satellite image processing platform based on Kintex-7 FPGA.Specifically,the tail frame head frame detection module,the interframe compression module,and framing module are tested.The experimental results show that the directional fault injection method can complete the fault injection on the specified function module,fault injection rate increased from 10.6% for the random fault injection method to 87.5% for the directed fault injection method.87.5%.