Font Size: a A A

The Design,Test And Analysis Of A SRAM PUF Chip Based On BCH Algorithm

Posted on:2022-08-15Degree:MasterType:Thesis
Country:ChinaCandidate:J L ZhangFull Text:PDF
GTID:2518306323978999Subject:Microelectronics and Solid State Electronics
Abstract/Summary:PDF Full Text Request
With the development of information technology,information security plays an increasingly important role.In the preparation process of electronic components,because of the inevitable differences in the preparation process,each chip has its own unique identity,and accordingly,the chip technology of physical unclonable functions(PUF)has been developed.Memory based PUF(SRAM PUF)due to the deviation of the bistable state,the transition between the steady state and the unsteady state has a clear direction,so that its output has the uniqueness and randomness,can be used as a random number.PUF chips have been widely used in the field of password security due to the advantages of integrated circuit manufacturing and low unit cost.In data communication,this uniqueness can be used to securely generate and store encryption keys and to encrypt information to protect the communication process.In some application scenarios,it is necessary to verify the identity of the device.This requirement can be realized through the challenge-response function.This method is called authentication.However,at present,the output characteristics of most PUF chips are greatly affected by the use environment.With the extension of use time,the stability of PUF chips will be greatly reduced and a series of problems will occur.The defects of current PUF chips in the market will lead to serious information security problems.To this end,this paper introduces a kind of SRAM PUF technology with higher stability and security,which is prepared by Huahong Semiconductor 0.11?m process,and enhanced PUF security by embedded BCH algorithm.In order to test the new energy of the PUF chip,a special test platform is set up to test it.The stability of the PUF chip was verified from the Angle of temperature and voltage.The performance of the PUF chip was evaluated from the aspects of hamming distance,inter-chip hamming distance,uniformity,bit error rate,etc.Through various tests,a high security SRAM PUF chip based on BCH error correction algorithm is verified and completed.
Keywords/Search Tags:STAM32F4, SRAM PUF, Voltage Stability, Device Noise, Information Security
PDF Full Text Request
Related items